TANAKA's MPC-6 has been designed with simple, robust and versatile concept for automatic determination of POUR POINT (PP) and CLOUD POINT (CP) with small specimen size, shorter test cycle time and high precision.

PP measurement is done by AIR PRESSURE METHOD (ASTM D6749), and CP measurement is by SMALL TEST JAR METHOD (ASTM D7683). Pour point is tested at different pressures so that parameter optimization can be easily done. Equipped with CFC-free internal cooler sample temperature of -80°C can be reached without external chiller.

The epoch-making automatic PP test method yields 1°C test resolution, while the new CP method yields 0.1°C resolution. Data can be exported to LIMS or optional printer via Ethernet.